Structure Optimization Of Vertical Microstructure Turbulence Profiler

Measurement of microstructure turbulence is important to study ocean globalcirculation and recognize the rule of ocean inner change. The key of studymicrostructure turbulence is get the dissipation of turbulence kinetic energy, and thevertical microstructure profiler with the shear sensor is the most effective platform formeasuring the microstructure turbulence. The accuracy of microstructure profiler isaffected by various factors, such as flow-induced vibration, fall speed variations,calibration errors, anisotropy in the turbulent velocity field, and so on. The accuracyof measurement constrain the development of microstructure profiler, highermeasurement accuracy is the primary goal of the vertical profiler.Focused on flow-induced vibration and sinking velocity of microstructureprofiler. The mechanism of flow-induced vibration of microstructure profiler wasinvestigated by using CFD software and fluid-structure interaction method. Then,structure of the profiler was optimized. In this paper, the obtained achievements are asfollows:(1) According to the principle of vertical profiles, the factors influencingmeasurement accuracy of microstructure profiler were analyzed, which is thefoundation of structural optimization.(2) Using fluid-structure interaction and LES methods to research flow-inducedvibration of profiler. Observe vortex shedding of profiler and the state of motion whenprofiler sinking, the mechanism of flow-induced vibration of microstructure profilerwas investigated.(3) Using fluid-structure interaction to calculate the flow-induced vibrations,obtained the relationship between the structure and flow-induced vibration. Optimizethe structure of profiler to reduce the flow-induced vibration.(4) Analyzing the range and the determinants of sinking velocity. Then, find thedrag coefficient of brush is the key factor to control sinking velocity. Use thefluid-structure interaction method to calculate the drag coefficient of brush, which isthe basis to control descending speed of profiler.