Fabric Defect Inspection System Base On Machine Vision

As the development of machine vision, Industrial inspection automation has become reality. Fabric defect inspection technology is also taking the place of the traditional artificial methods gradually. However, most of the existing scientific achievements are still in the theoretical stage. Productization of those achievements is unsatisfactory. After nearly three years of research and development, a new set of fabric defect inspection system that meets the industrial testing requirements has been developed, which will be introduced in this paper, covering the whole development process of hardware, algorithms, application software and controller those four aspects as well as detailed experimental results. It is more of engineering properties rather than only theoretical analysis, thus providing a good new way of thinking for the R&D of such products. The main contents of each chapter of this paper are as follows:Chapter I mainly introduces the present domestic and overseas R&D situation of fabric defect inspection algorithm and system as well as the contribution it has made to the development of national light industry. This chapter makes a brief analysis of the present commonly used fabric defect inspection algorithms and the advantages and disadvantages of fabric defect inspection products produced both home or abroad.Chapter II mainly introduces the new fabric defect inspection system from four aspects namely the hardware, algorithms, application software and controller. This’chapter begins with vivid demonstration of how the systems works on the warp knitting machine; the hardware part introduces the DM6467-based hardware platform as well as the function and operating principle of each module; algorithms part focuses on the work flow; software part introduces framework and stability of the system, etc.; and the controller part is a brief introduction of human-machine control terminal.Chapter III is a detailed introduction of the hardware part. DM6467platform is chosen to balance the performance and price. Hardware modules used in the system, including VPIF, Ethernet, serial interface, RS485bus and so on, is introduced, and1080p video processing can be achieved.Chapter IV is the core part of the paper. Starting from common fabric defect inspection algorithms, this chapter give a full and systematic description of fabric defect inspection algorithm which is based on wavelet transform. Related knowledge of wavelet and the whole algorithm process, such as pretreatment, wavelet transform and post processing, are also included. In the end, the reasonability and effectiveness of the algorithm are tested on embedded device under Windows application programs. Chapter V mainly consists of the application programs. It introduces the framework, stability and scalability of the system software according to the development approach of DM6467ARM+DSP.Chapter VI is about a new set of STM32-based controller, which is developed to meet customers’demand and further humanize the whole system. The controller should be used cooperatively with fabric defect inspection equipment. Both the hardware and software of the controller are fully introduced in this chapter.Chapter VII, the last chapter, gives a summary of this paper. The contribution and deficiencies of this fabric defect inspection system are also listed, which could be a reference for following updates.