Research On An All-optical Solid-state Scanner

Design an all-optical solid-state scanner chip, which can realize high speed lightdeflection in a very small space, instead of electron beam deflection scan imageconverter tube and opto-mechanical scanner, cancel the complicated mechanicalcomponents, use the all-optical scanning to realize the super fast phenomenonobservation. The beam deflection system is based on semiconductor opticalwaveguide core layer carrier induced refractive index change effect to realize, itsdevelopment work is mainly divided into semiconductor optical waveguide and sawprisms two parts. And through the experiment, we measured the light deflectioncharacteristics of the scanner and beam mode in the waveguide.Firstly, we discussed the basic principle of all-optical solid scanner in this paper.According to the carrier induced refractive index change theory, we elaborate thebasic working principle of the scanner. According to the planar optical waveguidetheory, we discussed the single mode working conditions and designed the mainstructure of scanner. Combined with the current experimental conditions, our work isas follows:1. According to the carrier induced refractive index change theory, planar opticalwaveguide theory and heterojunction theory, we explained the basic principle of thescanner.2. According to the theoretical calculation, we design the epitaxial structure ofthe scanner chip.3.Design the optical surface metal mask shape and use the software traceprodesign the simulation experiment to test the signal beam deflection.4.Building experiment platform to test the beam deflection characteristics andthe beam mode in the waveguide.