Research On The Welding Line Quality Detecting Technology Based On Linear Structure Light Measurement Theory

Recently, the technology of machine vision is promoted greatly by sensor technology,computer technology and digital image processing technology and it is now used widely invarious industries. Structure light measurement technology, one of the important branches ofMachine vision, is now playing a significant role in high-grade, high-precision and advancedmeasuring region caused its higher precision, faster measuring speed and non-contactmeasurement. This paper discusses a measurement system that using the linear structure lightto detection the quality of weld-seam. This system simplifies the processes of measurementand avoids a lot of mathematical computation by using the special structure of the system,makes it easy to port to the embedded system. Then, this paper ports the system to theembedded system which running Android operating system, it makes the measurement systemminiaturization, and can also get the result faster and more precise. The main works this paperdoes are as the list:1. It research the theories of measurement using structure light, and proposes a simple,easily archived structure of measurement system, and a model of linear structure lightmeasurement system.2. It discusses the methods of camera calibration, calibrates the camera and calculates itsintrinsic matrix and distortion coeff, then undistorted the camera distort.3. It studies the method of calculating the structure parameters of measurement system,and then calculates the parameters by using a simple but high precision way.4. It discusses the processing of the images that contain the linear structure light graph,including the image de-noising and image morphology. It focuses on the image thinningmethods, and then achieves a simple, fast image thinning method suitable for thismeasurement system.5. Testing the measurement system, getting the measured data, then analyzed the dataand finding what factors influence on measuring accuracy and then optimizes it.This paper archives the basic work of measurement using linear structure light onembedded system, then the measurement theories, the structure of the measurement system, the image process methods can be optimized further, so a faster, more accuracy linearstructure light measurement system can be archived on embedded system.