With the development of integrated circuits, the conventional material SiO2cannot meet therequirements of the gate dielectric material. The rare earth oxides are attracted widespread attention,owing to having a high dielectric constant (k (La2O3)=27, k (Gd2O3)=16) and excellentthermodynamic stability. The atomic layer deposition (ALD) can be applied in preparing high-qualityrare earth oxide film. The Key problem is the selection of suitable precursor with good properties.The main research work in this thesis is design, synthesis a series of Lanthanide/gadoliniumcomplexes (precursor) bearing hydrazones ligand. The complexes obtained were characterized byelemental analysis,1H NMR,13C{H} NMR and X-ray single crystal diffraction. The TG was alsoused to determine the thermal stability as well as the decomposition mechanism. The research workincludes the following two parts:Part one: Synthesis and characterization of hydrazones Lanthanide/gadolinium complexesHomoleptic rare-earth hydrazones complexes La[Ph(OCNNC)MePh]3(2a),La[Ph(OCNNC)MeEt]3(2b), La[Ph(OCNNC)C5H10]3(2c), Gd[Ph(OCNNC)MePh]3(2d),Gd[Ph(OCNNC)MeEt]3(2e), Gd[Ph(OCNNC)C5H10]3(2f) were synthesized by using anhydrousLnCl3(THF)x(Ln=La,Gd) reacting with3equiv of lithium hydrazones in THF. The complexesobtained were characterized by elemental analysis,1H NMR,13C{H} NMR spectroscopy. The thermalanalysis and decomposition mechanism of the complex2b was preliminarily studied byThemoGravimetry.Lanthanide and gadolinium complexes (PhCONNCMeC6H4)2La2[N(SiMe3)2]2(THF)2(3a),La(PhCONNCCH3Ph)3(3b),(PhCONNCC5H9)2La2[N(SiMe)2]2(THF)2(3c), La(PhCONNCC5H10)3(3d),(PhCONNCMeCHMe)2La2[N(SiCH3)2]2(THF)2(3e), La(PhCONNCMeCHMe)3(3f),(PhCONNCMeC6H4)2Gd2[N(SiMe)2]2(3g), Gd(PhCONNCMePh)3(3h),(PhCONNCC5H9)2Gd2[N(SiMe3)2]2(THF)2(3i), Gd(PhCONNCC5H10)3(3j),(PhCONNCMeCHMe)2Gd2[N(SiCH3)2]2(THF)2(3k) and Gd(PhCONNCMeCHMe)3(3l) weresynthesized by protolysis of Ln[N(SiMe3)2]3with hydrazones. The complexes obtained werecharacterized by elemental analysis,1H NMR and13C{H} NMR spectroscopy. Complex3c、3e、3khave been characterized by X-ray single crystal analysis.Part two: Preparation and Purification of TEMAH/TEMAZ TEMAH and TEMAZ are good precursors for the deposition of ZrO2and HfO2high-k gatedielectric material. The key problem is the preparation and purification. In this part, the TEMAH andTEMAZ were synthesized using ZrCl4/HfCl4as starting material reacting with LiN(Me)Et. Thepurification method was also studied and the final purity of complound obtained reached4N. |