Simulation Of Generation And Distribution Of X-rays In225Kev X-ray Source Platform

Industrial CT is an imaging technology which uses the ray attenuation information collected from different angle of object to reconstruct the internal structure of test object. X-ray source is an important part of the Industrial CT system which has a significant impact on the performance of the system. In this paper, we have done a series of simulation work focused on the X-ray source. The simulation result can provide a reference and help on the application of X-ray source in the Industrial CT system and other areas. This paper mainly includes the following sections:(1) We have simulated X-ray spectrum and intensity distribution of the X-ray source used in industrial cone-beam CT system with the highest energy of225keV by using Monte Carlo method. The simulation results can provide some help for. scatter correction and beam hardening correction in the process of image reconstruction and help to determine the minimum sensitivity of detector, and provide a reference for the shielding system design.(2) By using Monte Carlo method, we have simulated the bremsstrahlung photon yield and angular distributions of several different low-energy electrons, and summarized the variation of photon yield and the proportion of peaks of tungsten with angle and the energy of incident electron. The simulation results can provide a reference for the application of low-energy X-rays.(3) We have also introduced the basic principles of diffraction enhanced imaging. Then we simulate the intensity of X-rays generated from the process of Bragg diffraction by using Monte Carlo methods. The simulation results can provide a data basis for us to calculate the attenuation level of radiation intensity after monochromatization and provide a reference for estimating the scan time of the diffraction enhanced imaging system and the utilization of X-rays.