Image Recognition And Distance Measurement Of IC Probes

Combined with the needs of the production line in the industrial sector, this papertakes two different kinds of IC probes as research objects, and respectively studies therelevant techniques and methods of pattern recognition and distance measurement of the ICprobe images, with the development of the probe automatically check system which isbased on the image pattern recognition and the probe distance measurement software witchis based on image processing.In the aspect of the vertical type IC probe pattern recognition: the size and the shapefeatures of the probe samples belonging to different molds are analyzed in detail, the shapefeature parameters are proposed to recognize the different molds of probes according totheir shape features, and the probe feature database is established; this paper introduces aprobe shape feature extraction method in detail, with16molds of probes which belong tothree series as examples; probe pattern recognition system is developed using MATLAB,and experiments indicate that the system has the functions of mage acquisition, imagepreprocessing, feature extraction, pattern recognition and alarming.In the aspect of the cantilever type IC probe distance measurement: based on thefeatures of the probes and backgrounds in the production line, the suitable algorithms ofprobe image preprocessing which includes image denoising, image segmentation andmorphology operations are studied, removing the background interference effectively;according to the topology features of probe binary image, this paper designs the methodsof identifying the probe location and measuring the distance between probes; this paperrealizes the above methods by using VC++and MATLAB GUIDE programming, anddevelops the probe distance measurement software with the functions of image acquisition,image calibration, probe position identification, probe distance measurement, and themeasurement data storage.