Testing And Analysis The Parameter1/f Noise

There has been a history of51years since Laser was researched out in1962, along with the rapid development of electronic technology, highpower semiconductor laser performance improving. In recent years, highpower semiconductor laser has been widely used in agricultural,industrial, medical and military and other fields. With the widelyapplication of the high-power semiconductor laser, and its reliabilityproblems appear very important. The1/f noise is we used to judge thereliability of the laser standard so far.This article mainly aims at the1/f noise of high power semiconductorlaser for testing and research. The beginning the thesis introduces thedevelopment history and application background of the semiconductorlasers, and then the common noise in semiconductor laser has carried onthe narration, including the1/f noise in this paper. Next introduced the1/fnoise of two kinds of physical model, the surface of the carrier numbermodel and mobility fluctuation model, and then introduces the1/f noisetest system. By relying on the hardware test system, this article is to takeadvantage of low noise preamplifier noise amplification, and then usedlow frequency spectrum analyzer measurement and data processing.Experiment tests the different808nm1/f noise characteristic of the highpower semiconductor laser. For high power semiconductor laser test research of1/f noise is the keyto estimate its parameters accurately, this article applies the method ofleast squares straight line fitting, through combined with signal to noiseratio, calculate the corresponding parameters of1/f, reuse the1/f noisewavelet inverse transform reconstruction. Good from white noise underthe background of the reconstruction out of the1/f noise.