Research On The Key Tachnology Of CMOS Sensor Defect Detection

With the wide application of CMOS devices, artificial detection has been unable to meet the production demand and product quality requirements, need to be developed for testing the performance index of automation equipment. This article in view of the current CMOS chip manual testing, design of automatic optical inspection system, to meet the requirement of automatic testing for CMOS chip. System optimization of the light source lighting methods, according to the characteristic of LED based on voltage source automatic control, and the color light color mixing. System by the mechanical hands instead of manpower to the detected CMOS chip sorting, analysis of the manipulator with X, Y direction displacement accuracy. System using monocular vision technology, image processing technology is judged by grabbing a chip position, and through the image coordinates and the system coordinate conversion between, the chip rotation correction and positioning, achieved during the chip testing chip pin and the contact precision alignment. Finally, verified the system image coordinate system coordinate system and the feasibility of the calibration method.