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Research On Test And Diagnosis Technology Based On Multi-bus Automatic Test System

Posted on:2013-01-29Degree:MasterType:Thesis
Country:ChinaCandidate:Y P QiuFull Text:PDF
GTID:2248330374957175Subject:Control Science and Engineering
Abstract/Summary:PDF Full Text Request
The development of Industrial technology is rapid, especially electronics,the trend of circuit is small size, high integration and multi-function. Variouskinds of electronic equipments’ performance are higher and higher,miscellaneous equipment structure increases the difficulties in equipment faultdetection, therefore, the disadvantages of early artificial testing method aremore and more prominent. Artificial testing method has high requirement ontest people, long test cycle and big possibility of damage the valuableinstrument during the test. People are eager to create a new system that canmeet the needs of modern testing, then, automated test system (ATS) cameinto being.With the development of test bus, virtual instrument, programmableinterface and Artificial intelligence, ATS gradually improved, and played asignificant role in various test and fault diagnosis of electronic equipment.This paper analyzed systematically several key technologies of multi-busATS, its development and application, then researched the circuit testing anddiagnosis technology of ATS. Around several features of test bus and theappropriate computer technology, ATS were applied to automatic test andcontrol software of short distance wireless communication module, fault diagnosis of multi-bus ATS and the low-voltage power line carrier impedancetesting three parts.Automatic test and control software of short distance wirelesscommunication module used computer send SCPI commands through theGPIB bus to control a few instruments’ operation, in order to complete theemission and receiving performance test. Fault diagnosis of multi-bus ATSwas used ATS builded by GPIB, IEEE1394and VXI three kinds of bus, testedthe circuit board’s function and fault with the TPS software resources, then,joined the support vector machine (SVM) classifier based on geneticalgorithm (GA), improved the accurate rate of fault diagnosis. Low-voltagepower line carrier wave impedance ATS increased the way of LXI based onthe original communication modes of USB and GPRS, made the impedanceautomatic testing more convenient. Multi-bus ATS developed to the directionof universal and intelligent in the field of test and fault diagnosis. It effectivelypromoted the development of industrial, improved the economic benefits andsafety.
Keywords/Search Tags:Multi-bus, ATS, fault diagnosis, TPS, LXI
PDF Full Text Request
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