Design Of A Parameters’ Test System For Chip NCP1606

People are paying more attention to the great impact of power pollution on normaloperation of devices, so active power factor correction technology has been widely usedto improve the power efficiency. Many chip manufactures begin to develop and produceactive power factor correction control chip. A test system based on MCU is given in thispaper for testing ten parameters of chipNCP1606.The active power factor correction technology and chip NCP1606are simplydescribed in this paper. And the system for testing parameters is designed which mainlyincludes power circuit, D/A converter circuit, LCD display circuit, adjustable voltagesource circuit and current measurement circuit. Then the test program for ten groups ofparameters of the chip NCP1606is introduced.According to the test results, ten groups of parameters of chip NCP1606could besuccessfully tested by the test system designed in this paper and high precision could bereached. The test system could also be modified to test parameters of similar chips.