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Study On The Data Processing Of Ultrasonic Inspection And Measurement

Posted on:2013-02-04Degree:MasterType:Thesis
Country:ChinaCandidate:H D WangFull Text:PDF
GTID:2218330371960660Subject:Mechanical engineering
Abstract/Summary:PDF Full Text Request
Ultrasoinc non-destructive inspection was widely used in products all-sided quality control. Study on the data processing of ultrasonic inspection and measurement is helpful to increase productivity effect and guarantee product quality, it is more and more important in industrial production,new material reaearch and many fields.Combined with Natural Science Foundation of Zhejiang Province and Natural Science Foundation of China,data processing and image processing are carried out in-depth study.In chapter 1, the background of the research work and important significance of the thesis was discussed.The ultrasonic inspection and measurement researching situation all over the world was introduced. The Mathematical morphology was introduced. The bule print and detailed research contents of the thesis were given.In chapter 2, the basic principles of the ultrasonic inspection and measurement was introduced,the classification and testing methods of ultrasonic inspection and measurement were described.In chapter 3,the noise source of composite material and titanium alloy in ultrasonic inspection and measurement was described and the noise model was built. The principle of sparse decomposition and K-SVD Orthogonal matching pursuit was discussed,and this method was used in A-wave empirical data de-noise.The data processing result was compared with wavelet de-noise.In chapter 4,.The K-SVD Orthogonal matching pursuit was used in C-wave emprical data de-noise.The result of the image processing was compared with wacelet de-noise.The Mathematical Morphology was used in longhole C-wave emprical data image processing,image distortion was solved.In chapter 5,the full text was summarized and the possible research in future is presented.
Keywords/Search Tags:noise model, Sparse decomposition, Data de-noise, Image de-noise, Mathematical Morphology, longhole C-wave
PDF Full Text Request
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