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The Analysis And Design Of Management System For Pattern Approvla Of Measuring Instruments

Posted on:2012-10-21Degree:MasterType:Thesis
Country:ChinaCandidate:S ZhangFull Text:PDF
GTID:2212330338462410Subject:Computer technology
Abstract/Summary:PDF Full Text Request
The Pattern Approval of Measuring Instrument is the administrative licensing activity carried out by the quality and technology supervision authority for measuring instruments to verify if their patterns meet the statutory requirements, including pattern evaluation and approval decision. The pattern evaluation is an inspection of the measuring instrument pattern, with the purpose of determining whether the pattern can be approved, or whether rejection documents shall be issued. Due to the current lack of unified management and data transmission system, the provincial metering agencies and technical institutes are not in smooth communication, user information is poor circulated, and errors are not easily identified, among other problems. To solve these problems, the development of an integrated pattern evaluation mechanism of measuring instruments is necessary.At first,this paper introduce the current management situation of the domestic Pattern Approval management,and then analyzes the Pattern Approval process,on that basis, analyzes the requirements for Pattern Approval of measuring instruments by the various parts of the management system, applies UML tools to describe the functional needs of the management system for Pattern Approval management system. And then, design the architecture of management system,including the functional structure of the system. At last intruduce the actualization of the management system.The successful development and use of management system for Pattern Approval of measuring instruments may help enterprises accelerate the Pattern Approval of measuring instruments, make the management and control of Pattern Approval intelligent, automated and standardized, and help improve the overall management level of quality and technology supervision department, reduce omissions in work, avoid duplication of labor, improve test quality and efficiency, and better serve the people.
Keywords/Search Tags:Pattern Approval of Measuring Instrument, J2EE, UML, EJB
PDF Full Text Request
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