Residual Stress Determination Of Nickel-based Monocrystalline Superalloy AMI By X-Ray Diffraction

X-ray diffraction is a method of non-destruction, non-pollution, efficient, high precision. Therefore it was used in qualitative or quantitative phase analysis, crystal structure analysis, the material structure analysis, macro-stress and micro-stress determination fields. Single crystal superalloy is a major aircraft engine component materials working in high temperature, the single crystal superalloys will also be more widely used in the fields of terrestrial and marine gas engine. High-temperature single-crystal nickel-base alloys AM1 are mainly used in the area of aircraft engines .The residual stress of a nickel-based monocrystalline superalloy AM1 samples was calculated using the diffraction peaks measured by X-Ray Diffraction. In the paper, the influence of diffraction position precision and diffraction angel precision on measuring result was analyzed, and the results of the method Ortner and the method Imura were compared, the effect of the repetition for determination the position of the plans diffracted are also analyzed. The results show that the Ortner method can be used for the measuring of residual strain and stress of the shot peened signal crystal. A tensor matrix could be calculated by measurement of more than 6 plans. With the diffraction position step of 0.3°, and the diffraction angle step of 0.01°, the expected results can be obtained, Y W U Y Y ?Y UW [ Y ZW ^ of the result, and more than 16 results can improve the Static error.