Eft Test With The Performance Of Electronic Devices

There are most kinds of electromagnetic interference in the electronic products. The electromagnetic interference not only can affect the normal operation of electronic equipment, but also cause some certain components damage. This can reduce the EMC performance of electronic equipment. In this paper, I discuss and analysis the electronic equipment's performance about electrical fast transient burst test (EFT).In this paper, I describe in detail about some of the basics of EFT experiment from the system-level test and IC-level EFT; we introduce the test method and test system about EFT, and give the standards and examples of the test systems.Secondly, I analysis the electrical fast transient burst from its spectrum, coupling mechanism, interference means. We have to analyze the chip's technical information, design the EMC test board for IC-level EMC before the test. Then I do the EFT test for the equipment and chip, to find the sensitive areas and the cause for failure by anglicizing the test data and circuit schematics of the equipment.After anglicizing the route optimization and circuit layout design of the PCB, I put forward a series of rectification. And I analysis the grounding of the entire device to identify the risk of electromagnetic compatibility for the ground, then to analysis the interference suppression on the power input port and the optical isolation of the equipment, then I give some proposed corrective measures. Software designs are also given as a reference program.In order to do some researches for the EMC of IC, I analysis the reasons for chip failure, design and simulate an EFT protection circuit. At the last I summarize some measures used to prevent and suppress the phenomenon of effective Latch up measures.Finally, I do the EFT test for equipment and chip after the rectification, to validate my rectification plans.