Crystal Wafer Defect Detection Based On Digital Image Processing

In Modern society, our life have been changed by More and more Electronic products , As a prat of many Electronic products, Crystal oscillator circuit are used widely because of it's steady frequency. However, many defects, especially the tiny defects that cann't be seen by naked eye limited the scope of its application, the traditional method of defect detection is not satisfactory. how to detect tiny defects with low cost is the goal of our efforts. So this subject has very broad application prospects.Firstly, Many Common detection methods are introduced in this paper, by analyze every method's advantages and disadvantages , we designed the clip's defect Detection system, choose Camera and explain the reasons, then make our choice for light source and design the lighting program, set up the Image acquisition platform, after the Image collected, many arithmetic were been study for detecting tiny defect. And give our methold to get the clip's angle between the horizon.This methold has been proved to be more precise than Hough Transform. traditional Hough transform algorithm has been improved at the same time, the improved Hough transform turn out to be stronger anti-interference ability. And found that the traditional definition of Hough transform have some bugs in the level of definition.Our finally ultimate goal is to detect the defect, even the tiny defect that cann't be find by naked eye.Arithmetic used in Pattern Recognition is the key of the subject. The series steps belongs to the digital image processing and it can be realized with the Visual C++ 6.0.