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Components Pinhole Flaw Detector Test

Posted on:2009-06-11Degree:MasterType:Thesis
Country:ChinaCandidate:Y XiaFull Text:PDF
GTID:2208360245479625Subject:Optical Engineering
Abstract/Summary:PDF Full Text Request
Groupware Pinhole-Blemish Detected Device is used for cathode groupware detection before finished product. Besides, the device is also used for surface detection of GaAs material.The system researched by this dissertation is based on digital image processing and computer auto control and it makes the surface detection of cathode groupware and GaAs material automatic, scientific and intelligent. In future, the system will be widely used in photoelectron industry.This dissertation expatiate the basic theory and analyze several arithmetic feasibility of auto focus, design arithmetic of auto focus in the Groupware Pinhole-Blemish Detected Device. Otherwise, the studies of image analyze arithmetic also in this dissertation, and some suggestions of promotion the quality of image have been given.Groupware Pinhole-Blemish Detected Device's hardware system on the basis of previous improvements, the installation of a variable fixture, coaxial transmission source, weight loss devices, and so on. At the same time, hardware-based system in the software programming has done a great improvement, when also done this in detail.The another point of this dissertation is how to use it, how to design the UI (User Interface) and how to control it. Experiments of surface detection, auto focus and pinhole blemish are also important.Finally, although summarize of the dissertation, analyze the insufficiency of work and the expectation of the future.
Keywords/Search Tags:blemish detected, auto focus, image analyze, auto control, GaAs material
PDF Full Text Request
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