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Millimeter-wave Wideband Low-loss Dielectric Complex Permittivity Testing Technology

Posted on:2006-01-04Degree:MasterType:Thesis
Country:ChinaCandidate:D H ZhuFull Text:PDF
GTID:2208360152498545Subject:Radio Physics
Abstract/Summary:PDF Full Text Request
The Development of the communication and electronic countermining has promoted the research and development of the dielectric materials.But the Subject which designers of material and circuit care about most is how to test the complex permittivity of dielectric materials quickly and accurately in microwave and millimeter wave bands.The paper analyzes the measurement methods. The measurement system is built with the methods of the TE_omn, high-Q multimode circular cavity and the mode purifying and cavity dimension optimizing techniques and solved the problem of mode identifying automatically and mode searching in the test of low loss dielectric material. The broadband test cavity have been designed,and set up the broadband autotest system.The measurement system of stability and repeating have been analyed at experiment in the this paper.The measurement range and measurement errors of the test system are as follows:Frequency: Measurement range:Measurement errors:...
Keywords/Search Tags:circular cavity, purification, complex permittivity, microwave measurement
PDF Full Text Request
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