Time Input / Output Automata, Conformance Testing

A model of timed I/O automata is introduced, together with a notion of test sequence for this model. After introducing the grid automaton, a test suite derivation algorithm for black-box conformance testing of timed I/O automata is given. Although it's the first algorithm that yields a finite and complete set of tests for dense real-time systems, it results in a test suite of high exponential size and cannot be claimed of practical value. To solve this problem, a model of minimizable timed automata is introduced to describe dense real-time systems. Then a algorithm for constructing transition cover T is given, and therefore it is proven that with MTA model, the number of test sequences of the non-minimal automata derived by the algorithm will be reduced dramatically. Without affecting the completeness of the algorithm, this method makes it more practical.