Transient Voltage Suppression Diode Reliability Screening Process Research

Transient voltage suppression diode is abbreviated TVSD. It is designed as a high performance protective device to solve the voltage transient and current surges problem which is generated by electronic equipment circuit switching, electrostatic discharge, and electromagnetic interference. It's one of the most important electronic components in the electronic circuit. It has been widely applied to various civil and military electronic products. Particularly, in the aerospace, aviation, military equipment, and other fields, its reliability requirements have become increasingly high.Failure occurs when the product is in use, can cause very serious damage, and even result in casualties. The reliability of the screening process can be found in poor manufacturing process condition or defective products, removing potentially defective parts or products, pick out of early failure of the product, reduce the failure rate of submission of batches, to help improve product design and manufacturing process control, improve product quality and reliability level.Reliability screening is a very popular method of ensuring quality and reliability in the modern high-tech products. This paper is aiming at the reliability screening problem of the transient voltage suppression diode for the application as the main object of study in the stage of design, mass production, maintenance and improvement of reliability screening. In-depth analysis the basic principles, effect and conditions of transient voltage suppression diode reliability screening, the TVSD's reliability screening of components, the reliability of process control before packaging, the reliability screening process of packaged, reliability screening procedure and using reliability etc, were innovative and exploratory researched.