Research On Transient Current Testing IDDT Technology For Digital Circuit System

As designing technique of the digital system and manufacturing process of integrated circuit are improving day by day, the kinds of faults caused by transistor defect have became a main effect to digital circuit, which bring a strong challenge to the test technique.Firstly, a novel integrated intelligent fault diagnosis method based on the BP neural net work and the IDDT testing of digital circuit has been researched for some hard faults, such as bridge fault and resistive-open fault. Considering good properties of Wavelet analysis, fault feature of the sampled signal are extracted by wavelet package decomposition and processed by signal normalization and principal component analysis, which reduced the data dimension and shorten the training time. This method overcomes the localization of the traditional fault dictionary method and reaches a high and accurate fault diagnosis rate.Secondly, this paper first introduced the dynamic current analysis to test delay fault induced by cross-talk effect in digital circuit. SVMs are proposed to serve as classifiers to classify the different fault types in this method, which can greatly enhanced the recognition capability of fault components, and realize the fast and accurate fault localization of delay fault.The simulation results and the data analysis of the experimental circuits have illustrated that the method proposed in this paper is accurate and effective, obtains a better diagnosis effect.The work presented here in this paper has been funded by National Natural Science Foundation of China (60374008, 60501022), Aeronautic Science Foundation of China (2006ZD52044, 04I52068).