Using Monoscale Method In Electrical Noise Analysis

The noise inside the electronic devices (especially the low-frequency noise such as 1/f noise) is the key factor limiting the sensitivity and precision of the devices. And at the same time, it is the important sensitive parameter to characterize the quality and reliability of the devices. Therefore, noise has been studied and used widely as thediagnostic and evaluating tool.Up till now, the power spectral density is the traditional factor applied to characterizing the low-frequency noise in both the experiments and the theories. In order to make wavelet analysis under scales-limited signal ,we need monoscale wavelet analysis technique.In this paper a monoscale method is presented with its theory and arithmetic, and use it analyze single and cumulate RTS at different scales. It proved this method could obtain singularity information of signal under particular frequency by using monoscale analysis. By using it to noise of MOSFETs which is measured during radiated , we found this approach can be used to analysis the variety number of Interface traps.