Virtual Measurement And Process System Of 1/f Noise On Semiconductor Laser

With the development of the optoelectronic technique, semiconductor lasers (LDs) are widely used in optical fiber communication, optical sensor, information memory, medical treatment and pumping solid lasers. With the expansion of the excitonic wavelength, Spectral characteristic's improvement, the reducing of threshold current, the improvement of quantum transfer efficiency, the enhancement of output light power, the improvement of reliability etc, the superiority of the LD is more obvious. As a kind of important light source, the reliability of semiconductor lasers is imperative in all the applications. The study on the reliability of LDs and its regularity is very important to improve their specific property and use them rightly. At present, the usual method of screen is electric aging in which all devices are aged with a constant power or a constant current under high temperature and then the early failed devices are selected. In the aging, the reliable devices are also subject to screening, and the lifetime of devices is affected because of the hot and electric hurt. It can cause batches of devices damage when some accidence happens, for instance, the out of control system or power cut. On the other hand, electric aging is not sensitive for latent defects; for example, some devices after electric aging screening are usually found fail rapidly. Thus, the urgent problems are how to manufacture the high reliable devices, how to analyses the factors, which affect the device reliability, and how to select the unqualified devices with a fast, nondestructive and conveniently method. When LDs work, p-n junction voltage of it will tend to stochastic fluctuation, named electronic noise. Electric noise indicates the defect of material and...