Research And Development Of High Temperature Smelting Metal Measurement System Based On Wavelet Analyse

Wavelet analysis is obtained broad application and development in signal process, because it has especial time-frequency analysis capability. Image signal process is the important part of signal process, also wavelet analysis is applied in image signal proess. In order to measure the surface temperature field of high temperature smelting metal, the measure system is researched and developed based on CCD technique, contactless temperature technology and wavelet transform.In this paper, combined with thermal radiation theory, CCD working principle, optical system imaging theory and computer multimedia technology, the design method of the temperature measurement system is studied, and the necessary capability of CCD image sensor in this thermal radiation measurement system and the main factors in selecting CCD image sensor parts and image collection boards are analyzed as well.The theory of temperature measurement by using colorized CCD is summarized. The colormetry temperature measurement method of CCD and image segmentation technology by wavelet transform are researched, and the algorithm is designed, which can extract the target in fast. The 1-D wavelet transform of histogram of the intensity image got the best threshold, the effect of segmentation is all right. In 2-D wavelet algorithm, the bubble function is constructed,which had the capacity of signal auto-matched,and the threshold from wavelet modulus is given out. The 2-D wavelet algorithm can segment the aim image in fast, the effect is good. In this paper,compared the 1-D wavelet algorithm,2-D wavelet algorithm and the automatic threshold-taking method of the max square error, the results is show that 2-D wavelet algorithm is faster and more exact than the automatic threshold-taking method, and accurater than the 1-D wavelet algorithm.The CCD measurement system is calibrated.