Development And Application Of Dielectric Temperature Relationship Measurement System

Electronic materials are taking more and more important role in high-technology field, and the application field develops continuously, which puts forward to a higher request to the performance and application scope of electronic materials, and a higher demand to the corresponding material test method and equipment is setted. Since most overseas equipments are expensive and the domestic equipments are lack of precision and stability, this kind of electrical properties testing system is made simply in the domestic research institutions, which makes the integration and versatility is poor. In line with the design concept of high precision and good stability, as well as to meet the research demand of the Bi-based pyrochlore dielectric materials and the lack of research means on the dielectric ceramics in the other universities and enterprises, this paper studied and designed a dielectric materials testing system-the low temperature dielectric characteristic testing system. The function realization, performance index and expansion of this system reach a high level, and the system integration is achieved, also the objective of high accuracy, security and economic has been reached. The main findings are as follows.Firstly, the low temperature dielectric characteristic test system based on the precision LCR meter has been designed which consist heating, cooling, heat preservation and linear warming (1 ~ 10°C / min optional) System. Four merit position test system and with those corresponding multi-channel analog switch system has been obtained. A friendly man-machine interaction contact surface is compiled. The rotational test of four merit position samples can be implemented in identical temperature point (-150°C~220°C) and different frequency (20Hz~lMHz scope to be elect, each time may choose 1-10 frequency spots), which can accomplish automation temperature characteristic test such as data gathering, memory and graphical display. Secondly,aseriessystem of new pyrochlore compounds (Bi1.5Zn0.5-xSrx)( (BZSSN) (x=0~0.5) have been prepared by solid reaction technique. The low temperature dielectric properties of ceramics which detected by the low temperature dielectric characteristic test system had been studied. XRD results show that four samples have formed the single cubic pyrochlore structure. Dielectric constant and dielectric loss decrease with with the increase of Sr2+ amount. Four samples had showed dielectric frequency dispersion behavior, it was indicated that the frequency dispersion properties could be ascribed to the bending of O'-A-O' chain of the pyrochlore structure.