Investigation Of Stress Tester For Rare Earth Device

As the application range of rare earth device is very extensive, knowledge of the stress-strain relationship of rare earth device is helpful to optimize the work point of rare earth device, and to supervise the device design of a giant magnetostrictive alloy.The stress tester of rare earth device was designed and investigated, combined with the static property of giant magnetostrictive materials. The printed circuit board was designed, and the stress tester was debugged. The stress tester was composed of the hardware and software. The hardware was composed of several parts such as human-machine interface, analog-digital converter and so on. The software functions as data collection, data disposal and data output. The stress tester has characteristics of speediness and high precision.The static properties, such as magnetostriction, hysteresis loop, magnetomechanical coupling coefficient were measured with the magnetic measurement system of multiple parameters. It is found that the measurement result is reliable and repeated, and the parameters can be used to design a magnetostrictive device.The hardware circuit of the stress tester was designed on the base of circuit theory. The core of the control system is MCU(AT89S51). The circuit design mainly includes interface designs, such as address coding circuit, human-machine, AD converter, etc. The PCB was depicted and tested. The testing result indicates that the circuit design is logical, and it can reach an expected target.The software function flow was designed and hardware-soft testing of the stress tester was carried out. The software design mainly includes system initialization, key judgement, dataprocessing. The hardware-soft testing mainly includes MCU-AD interface testing, human-machine testing.The result analysis of stress tester indicates that the stress tester works steadily, quickly and precisely.