| Composite gels and thin films of Sn2+-doped TiO2, La3+/Ce3+-doped TiO2-20wt%SnO2 were prepared by the sol-gel method. The transformation process of composite gels was investigated by XRD, TG-DTA techniques, the relative content of rutile and granularity were analyzed. Besides, humidity sensing properties of thin films were tested, and the effect of ions doping were investigated.Experimental results show that, the transformation temperatures of gels to anatase appear at about 400℃, and anatase to rutile at about 500℃for pure TiO2. The transformation temperatures of gel to anatase and anatase to rutile first decrease and increase and then decrease with the increase of the ionic content for Sn2+-doped TiO2 and La3+-doped TiO2-20wt%SnO2. The transformation temperatures of gel to anatase first increase and decrease and then increase, and that of anatase to rutile always increase with an increase of the ionic content for Ce3+-doped TiO2-20wt%SnO2.Sn2+, La3+and Ce3+ doping restrained the growth of anatase and rutile, moreover, the granularity decreased with the increase of doping content. There are very complex effects of Sn2+, La3+ and Ce3+ doping on the transformations from gel to anatase and from anatase to rutile, which depressed the transformation of gel to anatase when sintered at 400℃, Sn2+ doping improved the transformation of anatase to rutile, La3+ doping first depressed and then improved, Ce3+ doping first improved and then depressed when sintered at 500℃, while Sn2+ doping first depressed and then improved the transformation of anatase to rutile, La3+ and Ce3+doping depressed when sintered at 600℃. La3+ and Ce3+ doping, stimulated the transformation of SnO2 phase at the same time.Sn2+, La3+ and Ce3+ doping decrease the electric resistance of TiO2 based films, presenting better linearity in the humidity-resisrance relations to some extent, which is related to the granularity decrease of anatase and rutile due to Sn2+, La3+ and Ce3+ doping, as well as the adhibition of crystal defect in anatase and rutile and that of phase boundary in thin films. |