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Properties of thin film radiation detectors and their application to dosimetry and quality assurance in x-ray imaging

Posted on:2015-09-28Degree:Ph.DType:Dissertation
University:University of Massachusetts LowellCandidate:Elshahat, BassemFull Text:PDF
GTID:1478390017490048Subject:Physics
Abstract/Summary:
The characteristics of two different types of thin-film radiation detectors are experimentally investigated: organic photovoltaic cells (OPV) and a new self-powered detector that operates based on high-energy secondary electrons (HEC). Although their working principles are substantially different, they both can be used for radiation detection and image formation in medical applications. OPVs with different active layer material thicknesses and aluminum electrode areas were fabricated. The OPV cell consisted of P3HT: PCBM photoactive materials, composed of donor and acceptor semiconducting organic materials, sandwiched between an aluminum electrode as anode and an indium tin oxide (ITO) electrode as a cathode. The detectors were exposed to 60150 kVp x rays, which generated photocurrent in the active layer. The electric charge production in the OPV cells was measured. The net current as function of beam energy (kVp) was proportional to ~1/kVp0.45 when adjusted for x-ray beam output. The best combination of parameters for these cells was 270-nm active layer thicknesses for 0.7cm-2 electrode area. The measured current ranged from about 0.7 to 2.4 nA/cm2 for 60-150 kVp, corresponding to about 0.09 -- 0.06 nA/cm2/mGy, respectively, when adjusted for the output x-ray source flux.;The HEC detection concept was recently proposed and experimentally demonstrated by a UML/HMS research group. HEC detection employs direct conversion of high-energy electron current to detector signal without external power and amplification. The potential of using HEC detectors for diagnostic imaging application was investigated by using a heterogeneous phantom consisting of a water cylinder with Al and wax rod inserts.
Keywords/Search Tags:Detectors, Radiation, OPV, X-ray, HEC
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