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Particle-induced X-ray emission: Instrumentation, calibration, and application to contact lens solutions and fulvic acid solutions

Posted on:1990-02-18Degree:Ph.DType:Dissertation
University:Brigham Young UniversityCandidate:Jenson, Douglas DFull Text:PDF
GTID:1470390017953946Subject:Chemistry
Abstract/Summary:
An expression was derived describing the profile of the proton beam at the PIXE target position. The expression was used to predict the profile for several experimental configurations. The profile was experimentally measured. The PIXE system was calibrated using solutions and commercial foils. Experimental data was adjusted for all absorbers and interferences, and a quadratic relationship was determined relating calibration factor and atomic number for each series of X-ray transitions. Calibration factors were determined for all elements above aluminum, for both a pinhole filter and a 14-mil mylar filter. A group of contact lens solutions was analyzed using PIXE, ICP, and ISE. A digestion method was developed for removal of chloride ion. Cluster analysis was used to classify the data. A commercial humic acid was separated into three fractions. The fulvic acid was characterized, and separations of metal-fulvic acid complexes from metal ions in solution were attempted using ultrafiltration.
Keywords/Search Tags:Acid, PIXE, Calibration, Solutions
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