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Advances and applications of the finite difference time domain (FDTD) method and scattering parameter measurement techniques for electromagnetic compatibility in high speed digital design

Posted on:2001-11-22Degree:Ph.DType:Dissertation
University:University of Missouri - RollaCandidate:Ye, XiaoningFull Text:PDF
GTID:1468390014459107Subject:Engineering
Abstract/Summary:
Electronic devices continue to operate at increasing speeds and consume more power, which significantly increases electromagnetic interference (EMI) concerns and makes it more challenging to meet the radiated emissions requirements. A reliable numerical modeling tool and/or an effective measurement technique are always desirable for evaluating EMC performance, developing design guidelines, or seeking possible design solutions. In this work, numerical modeling and experimental techniques were developed and applied, and were both directed toward engineering design for EMC.; Experimental techniques were developed and the finite-difference time-domain (FDTD) method was used to investigate and evaluate the EMI performance associated with inter-board connection for frequencies into the GHz range. The FDTD method was also successfully used as a design tool to provide insight and design directions for commercial connector products for EMC concerns.; EMI mitigation approaches that utilize multi-layer power bus stacks and via stitching of reference planes were studied, and, design curves and an empirical equation were provided.; New features were developed to improve the conventional FDTD method. A Debye model was incorporated to approximate the dispersive characteristics of the FR-4 dielectric substrate. Utilizing the numerical tool, EMC design for DC power buses was investigated by addressing typical issues in power bus noise reduction. Two-port networks were successfully incorporated into the modeling, given the S-parameters of the network. The improved codes were then applied for studying EMI filtering of I/O lines.
Keywords/Search Tags:EMI, FDTD, Method, Techniques, Power, EMC
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