| Frequency-selective surfaces (FSSs) are commonly used as dichroic filters in the microwave portion of the spectrum. These filters are typically configured as periodic arrays of metallic patches supported by a dielectric substrate, or as an array of apertures on a metallic sheet. To first order, the current-wave resonance of the individual patches or apertures determines the spectral behavior of the structure. The resonant dimension of the structures is on the order of a wavelength of the incident radiation. Using the high-resolution capabilities of direct-write electron-beam lithography (DEBL), the functionality of an FSS can be extended toward shorter wavelengths—into the infrared (IR), and even to visible wavelengths.; Design of FSSs at these short wavelengths presents new problems—the usual assumption of perfect metal conductivity is not valid in the IR. In our method-of-moments model, we use a frequency-dependent complex conductivity to characterize the metallic structure, which allows prediction of the location, magnitude, and spectral width of the resonance. We compare the measured behavior of our IR FSSs to the theoretical predictions and find good agreement over a wide range of structure sizes and materials. Treating the loss mechanism in this way allows us to predict resonant effects not only for reflection and transmission, but for absorption as well. Kirchoff's Law, which states that absorption and emissivity are equal on a spectral basis, provides a means to develop IR FSSs for which the spectral emissivity can be enhanced over a desired range of wavelengths. This characteristic has potential application in development of new sources for IR spectroscopy, and in IR-signature management.; Fabrication of IR FSSs by DEBL allows fine control over the dimensions of the metallic elements, but the direct write process is slow and hence too expensive for practical development of large-area IR FSSs. We investigated precision imprint embossing as a candidate method for low-cost replication, and have identified a range of process parameters that allow good transfer of surface characteristics, even at the fine resolutions required for IR FSSs. Measurements demonstrate that the desired spectral behavior has been preserved for these replicated surfaces. |
