A unified approach to x-ray absorption-refraction-extinction contrast with diffraction-enhanced imaging

The purpose of this study was to explore the potential of Diffraction Enhanced Imaging (DEI). Diffraction enhanced Imaging (DEI) is a recently developed imaging technique for radiography. The technique (DEI) utilizes a silicon crystal placed between the sample and the detector. The angular sensitivity of the crystal allows measuring the x-ray attenuation of the sample, the gradient of x-ray refraction, and rejection for the ultra-small angle scattering. The new method provides a way of imaging these contrast mechanisms. The DEI presents two images. The introduced images by DEI are apparent absorption and refraction images. Apparent absorption is a combined contrast due to extinction and absorption. Extinction contrast is a result of scatter rejection by the crystal. This study focuses on these contrast mechanisms and considers them separately. The new contrast mechanisms are used to present true absorption, refraction, extinction and scatter width images. This study also gives a much better description for refraction images and offers solutions to minimize image blurring due to refraction aberration effect.