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Bent crystal x-ray optics for synchrotron radiation research

Posted on:2004-03-17Degree:Ph.DType:Dissertation
University:Illinois Institute of TechnologyCandidate:Karanfil, CahitFull Text:PDF
GTID:1462390011968156Subject:Physics
Abstract/Summary:
This dissertation describes the concepts, optimization, implementation, and testing of three new devices that use the bent Laue crystal optic. These are the bent Laue analyzer (BLA), the bent Laue harmonic selector (“Beam Cleaner”), and an energy dispersive reflectometer based on polychromatic focusing optic. This new class of x-ray optic, originally developed for medical imaging by Suortti, Thomlinson, Zhong, and Chapman, has unusual characteristics: surprisingly good reflectivity and an angular acceptance 10–20 times greater than the intrinsic widths of flat perfect Silicon crystals. These properties open up a number of new applications, and make possible new devices that extend the utility of synchrotron radiation research.
Keywords/Search Tags:Bent, Optic, New
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