| High throughput and systematic study of complex material systems is described. Initial efforts using thin film discrete material chips are briefly reviewed in perspective of material discovery and optimization. We then focus our discussion to the experimental technique of epitaxial thin film growth “continuous phase diagram” (CPD) and mapping its physical properties in two different material systems; perovskite manganese oxides and Ni1-xFe x metal alloy. In the former, we discuss the results of mapping optical, electrical, and magnetic properties of manganese oxides as functions of doping concentration, ionic radius, etc. We discuss the surprising evidences that suggest various electronic phase transitions, such as orbital orderings and smectic phase formation, in this highly correlated electronic system. In Ni 1−xFex metal alloy, we discuss a different application of CPD to describe the structure-property relation of a traditional materials science. |
