| ron oxide films were grown by reactive evaporation on Cu(001) and Ag(002) substrates. These ultrathin films (less than 20A thick) were characterized by several surface science techniques. At these thicknesses, the oxide/substrate interaction and the quasi-two dimensional nature of the film dramatically effect the properties of these systems. The strong influence of the interfaces, along with the inherent complexity of the iron oxide system, required the characterization of the chemical, structural and magnetic properties in order to get a complete picture of the behavior of these systems.;Chemical analysis by AES, XPS and XAS reveal that, on both substrates, the most highly oxidized films consist of ;Structural characterization by LEED and STM found that the oxides grew in a (111) orientation with two domains, with the exception of the mixed iron/oxide films grown on Ag(001) for Fe/O ;Magnetic characterization was performed by MOKE and MCD. It is found that the oxides with Fe/O... |
