The structure and composition of chromate conversion coatings formed on aluminum-copper alloy AA2024-T3 and thin film analogs of constituent intermetallic compounds

A comprehensive suite of spectroscopy have been used to study the composition and structure of Chromate Conversion Coatings (CCC) formed on Aluminum Copper (Al-Cu) alloy AA2024-T3 and constituent Intermetallic Compounds (IMCs). Based on previous work the CCC formed over the IMCs is expected to be thinner and therefore different in structure and composition than the CCC formed on the matrix. The formation of the CCC over the different IMCs is expected to be dependent on the chemistry and the interaction of the IMCs with accelerators such as ferricyanide.; Surface chemical and structural data determined by X-ray Photoelectron Spectroscopy (XPS), Synchrotron Infrared Microspectroscopy, X-ray Absorption Near Edge Spectroscopy (XANES), Extended X-ray Absorption Fine Structure (EXAFS), Secondary Ion Mass Spectrometry (SIMS), and Secondary Electron Microscopy/Energy Dispersive Analysis of X-rays (SEM/EDAX) have been developed to refine an existing model for the CCC formed on the AA2024-T3 surface, an Al-Cu aircraft alloy, by considering the composition and structure of the CCC formed on constituent intermetallic compounds (IMCs). The limited corrosion behavior of AA2024-T3 aluminum alloy is generally attributed to the presence of a variety of constituent IMC. These IMC particles are of the order of 1–20 μm which makes their direct analysis exceedingly difficult and has lead to a limited understanding of their surface chemical properties relative to CCC formation. To overcome this limitation, it was necessary to develop for the first time large area samples composed of compositionally homogenous thin films of the various IMCs found on the AA2024-T3 surface, which were galvanically attached to thin films of Al-4.2wt%Cu (representative of the AA2024-T3 matrix). This was performed in a two-step process: Disks of IMC compositions were formed by Reactive Arc Melting (RAM), followed by ultra-fast laser ablation of the RAM IMCs resulting in the formation of homogenous thin films. The film thickness as determined by the laser confocal system was about 2.5 to 3.0 μm. These thin films were used to analyze the formation of CCC on IMCs, the AA2024-T3 matrix analog and matrix-IMC galvanic couples, respectively. SIMS depth profiling revealed significant variations in CCC film thickness and composition related to the underlying surface composition of each IMC. (Abstract shortened by UMI.)...