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Size dependence of the electrical characteristics of silicon nanoparticles

Posted on:2003-09-19Degree:Ph.DType:Dissertation
University:University of Illinois at Urbana-ChampaignCandidate:Therrien, Joel MathewFull Text:PDF
GTID:1461390011987069Subject:Physics
Abstract/Summary:
We studied the electronic properties of silicon nanoparticles with sizes ranging from 2.9 to 1 nm in diameter. Using a scanning tunneling microscope we studied the electronic structure of the particles. Resonant tunneling through hole states was observed when the samples were excited with light. The energy levels of these hole states were matched to theoretical models and the mass of the holes was determined. In addition, the Coulomb blockade effect was observed in the tunneling experiments. This effect was used to determine the dielectric constant of the particles. Both the hole mass and the dielectric constant are of importance to many fields, such as electronics, optoelectronics, and optics, where silicon nanoparticles have applications.
Keywords/Search Tags:Silicon
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