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Properties of Closed-Shell Titanium Silicate and Gallium-Containing Semiconductor Systems

Posted on:2012-12-23Degree:Ph.DType:Dissertation
University:North Carolina State UniversityCandidate:Stoute, Nicholas AaronFull Text:PDF
GTID:1451390011953688Subject:Physics
Abstract/Summary:
We demonstrate that an atomic-scale approach may be appropriate for the analysis of the compositional and bonding properties of titanium silicate alloys and shallow d-core level reflectance spectra of gallium-compound semiconductors.;Ti silicate analysis was conducted using X-Ray Absorption Spectroscopy (XAS), X-Ray Photoemission Spectroscopy (XPS), and Spectroscopic Ellipsometry (SE) data taken on a range of Ti-silicate alloys. XAS data were obtained by the Lucovsky group at Stanford Synchrotron Radiation Laboratories (SSRL) at the Stanford Linear Accelerator Center (SLAC), and were used as the primary source of information. To bolster conclusions we solicited XPS data from the Opila Laboratory at the University of Delaware, which were provided by Les Fleming. We also took SE data on Ti silicate alloys annealed at different temperatures using two ellipsometers, one of which was built by the author specifically to probe energies in the vacuum uv range. Reflectance data from 20 to 25 eV, which contain spectral features due to transitions from Ga3d core levels, were obtained on GaP, GaAs, GaSb, GaSe, and GaPxAs1ƒ{x at the storage ring Tantalus 1 at the Stoughton Synchrotron Radiation Center by Aspnes and co-workers from about 1980 to 1982.;Ti L2,3 XAS data were fitted with reference spectra to obtain 4-fold coordination concentrations (in differing symmetries) and 6-fold coordination concentrations with respect to alloy composition and annealing. Analyzing the concentrations allowed us to draw conclusions on coordination with respect to alloy composition and annealing. We were able to model the 4-fold ¡§in solution¡¨ to 6-fold phase-segregated conversion as a stochastic process, and we found a complete conversion to 6-fold phase-segregated TiO 2 through annealing with at least 36% Ti and above. We attributed this phase segregation to a striation effect previously reported in the literature. XAS OK1 spectra corroborate these results. Investigation of the XPS Ti L 2,3 data verified the formal Ti valence in the Ti silicate alloys as +4. Through atomic-multiplet calculations, we show that because of Coulombic and spin orbit effects the final states of the Ti L2,3 spectra do not maintain any significant degeneracy, even in the absence of a crystal field. Dielectric functions from 1.5 to 9.0 eV, extracted from the SE data obtained on annealed Ti silicate alloys, verified that significant coordination change occurred between the annealing temperature of 500 and 700 °C.;A local atomic multiplet theory was applied to investigate the Ga3d shallow core-level spectra of GaP, GaAs, GaSb, GaSe, and GaAs1-xP x. This is a novel application of an existing theory that is typically used for higher-energy transitions. We modeled these spectra quantitatively as a Ga+3 closed-shell ion affected by perturbations on 3d hole-4p electron final states, specifically spin-orbit effects on the hole and electron, and a crystal-field effect on the hole. The crystal-field perturbation arises from the surrounding bond charges and positive ligand anions. Radial-strength parameters were obtained through a least-squares process, and general trends identified with respect to anion electronegativity. Primary conclusion drawn is that the crystal-field effect, in addition to the spin-orbit interaction, plays a significant role in breaking d-level degeneracy, and consequently is necessary to understand shallow 3d core level spectra.
Keywords/Search Tags:Silicate, Spectra, Data, XAS
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