Research On Proton Radiation Effects On Charge Coupled Device With Experiment And Simulation Methods

Charge coupled device (CCD) is a key device used in the space imaging systems,which will be subjected to the harsh radiation environments when operating on theorbits. Though there are many studies on CCD radiation damage abroad, there are fewstudies in our country. As the present domestic study status and lack, the differentenergy proton radiation experiments on CCD and numerical simulation were firstlycarried out. With the experimental results and simulation results, the radiationmechanism was analyzed in depth. The similarities and differences of CCD irradiatedby different particles were carried out, and the evaluation means of CCD radiationdamage were studied in the paper. The main study contents of the paper were asfollows:The experiments of CCD irradiated by different energy protons werecarried out, and the radiation damage was analyzed. The degradation of thesensitive parameters and the radiation proton fluence which induced CCD intofunctional failure were compared. The differences of different energy protonradiation damage were analyzed by the particle transportation simulation. Theequivalence of the displacement radiation between low energy protons and highenergy protons was studied. So the evaluation of CCD damage by differentenergy proton radiation can be extended to the wide proton energy spectrum inthe natural space radiation environments.The numerical simulation of CCD irradiated by protons was carried out.The physical device simulation models were established and the clock circuitsof three-phase pulse were designed. The processes of signal charge formed andtransferred were simulated. The proton radiation damage models wereestablished, and the proton radiation effects on CCD were simulated.The differences of radiation damage by different particles such as protons,neutrons, electrons, and γ rays, were compared by the interactions of incidentparticles and the target materials, energy deposition, and the degradation ofradiation sensitive parameters. With the comparing of the experimental resultsof CCD irradiated by protons, neutrons, and γ rays, the charge transfer efficiency was determined to be the sensitive parameters of the protondisplacement radiation damage.The evaluation of CCD radiation damage was carried out. The evaluationmeans of NIEL, analytical calculation, radiation transfer, and stable defect wereintroduced. The new evaluation means of numerical simulation was presented,which can not only obtained the degradation of CCD radiation damage, but alsoknow about the radiation damage mechanism clearly.With the study of the paper, the experiment and simulation approacheswere validated. The radiation damage mechanism was made clear. Theachievement of this paper provide basis of theories and experimental techniquesfor CCD radiation hardening and radiation damage evaluation study.