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Keyword [resistivity]
Result: 101 - 120 | Page: 6 of 7
101. Impact Of The NiSi1-xGex Composition On The Electrical Properties Of Ge Channel Schottky-Barrier PMOSFETs
102. Research On Transparent N/P Type Semiconductor Thin Film Transistors
103. Study On The Properties Of Tungsten-doped Indium Oxide Transparent Conductive Films
104. Preparation And Properties Of Aluminum-Doped Zinc Oxide TCO Thin Films On Flexible Substrate
105. Study On Influence Of The Applied Electric Field On Metal-Assisted Chemical Etching
106. Research On Thin Layer Resistivity Test System For Silicon Wafer Based On Pseudo Measured Value Method
107. Preparation And Photoelectric Properties Of Transparent Conductive Films Of Tin-Doped Zinc Oxide
108. Design Of Semiconductor Material Measurement System Based On VI Technology
109. Study On Electrical Contact Characteristics Of Boron Nitride Nano-films
110. Design Of Block Resistance Meter With Pulsed Eddy Current Method
111. Preparation Of Hexagonal Phase Ito Powders And Cubic Pahse Ito Microspheres And Their Resistivity
112. Low resistivity contact methodologies for silicon, silicon germanium and silicon carbon source/drain junctions of nanoscale CMOS integrated circuits
113. Sub-surface imaging of cross-valley alluvial fans: Using ground penetrating radar (GPR) and electric resistivity ground imaging (ERGI) to determine Holocene sedimentation thicknesses in trunk valleys
114. Advances in electrical resistivity tomography: Modeling, electrode position errors, time-lapse monitoring of an injection/withdrawal experiment, and solution appraisal
115. Inspection of earthen embankment dams using time lapse electrical resistivity tomography
116. High Temperature Wireless Surface Acoustic Wave Gas Sensors Using Zinc Oxide and Tin Oxide Thin Films
117. Characterization of High-Resistivity Silicon Bulk and Silicon-on-Insulator Wafers
118. Dielectric breakdown in media with defects
119. A sequential inverse approach for hydraulic tomography and electrical resistivity tomography: An effective method for site characterization
120. The investigation of nanoscale effects on schottky interfaces and the scattering rates of high resistivity metals
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