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1. Nbti Effect Of Nano-cmos Devices And Its Physical Model
2. Reliability Study Of GaN-based High-electron-mobility Transistors
3. Failure Mechanism Research Of AlGaN/GaN HEMT Under Strong-electrical Stresses
4. Organic Electrical Bistable Devices Based On Tris(2-phenylpyridine)iridium(?)
5. Study On The Resistance Relaxation Feature Of Nonvolatile Memory Based On NiO And Nb:SrTiO3
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