Font Size:
a
A
A
Keyword [total ionizing dose(TID)]
Result: 1 - 9 | Page: 1 of 1
1.
Researches On Radiation Effects And Radiation-hardening Of Ferroelectric Random Access Memories
2.
Research On The Charge Trap Non-volatile Memories Design And Ionizingradiation Degradation Characteristics
3.
Temperature Modeling Of Total Ionizing Dose Effect In Deep Sub-micron CMOS
4.
The Conduction Mechanism And Radiation Tolerance Against TID Effect Of TiO
2
-based Resistive Switching Device
5.
Researches On Radiation Effects And Radiation-Hardening Of Resistive Random Access Memory
6.
Study Of Hot Carrier Injection Effect Based On 0.18um And 65nm Commercial CMOS Technology
7.
A Research On Test Method Of Radiation Effect Of Ferroelectric Random Access Memory
8.
Research On Structures And Characteristics For SOI Pixel Detector
9.
Design Of Radiation-hard High-voltage Gate Driver Circuit
<<First
<Prev Next>
Last>>
Jump to
