Font Size:
a
A
A
Keyword [test response compaction]
Result: 1 - 4 | Page: 1 of 1
1.
New Approaches To Test Compression For Digital Circuits
2.
The Study On Low-Cost Testing Techniques For Core Based System-on-chip And Practical Implementation
3.
On low power and circuit parameter independent tests, and a new method of test response compaction
4.
On methods to improve test generation efficiency and test response compaction
<<First
<Prev Next>
Last>>
Jump to
