test generation - Globe Thesis

Keyword [test generation] Result: 101 - 120 \| Page: 6 of 8
101.	Optimizing The Automatic Test Generation For Boolean Expressions
102.	The Research On Delay Test Vector Generation Method
103.	Test Generation Based On Composite Dependence Relation Coverage Criteria For EFSM
104.	Research And Application Of Test Case Generation Based On Improved Hybrid Genetic Algorithm
105.	High quality compact delay test generation
106.	JTracer: A framework for automatic test generation for secure Web applications
107.	Symbolic execution algorithms for test generation
108.	Scalable test generation for path delay faults
109.	Enhancing test data generation using constraint programming
110.	Formal analysis of timing behavior in test generation for computer and communication system
111.	Exploring temporal and spatial correlations on circuit variables for enhancing simulation-based test generation
112.	Satisfiability based sequential test generation and design for testability for mixed register-transfer/gate-level circuits
113.	Scalable and effective test generation for access control systems
114.	Design validation of behavioral descriptions for arbitrary fault models
115.	Fault simulation and test generation for small delay faults
116.	New test generation methods for transition delay faults in scan designs
117.	On test generation and fault diagnosis in scan built-in self-test
118.	Transition faults and transition path delay faults: Test generation, path selection, and built-in generation of functional broadside tests
119.	Search-based approach of automated test generation for state-based components
120.	Advanced test generation techniques: Improving yield and protecting intellectual property
<<First <Prev Next> Last>> Jump to