test application time - Globe Thesis

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Keyword [test application time] Result: 1 - 16 \| Page: 1 of 1
1.	Research On Application Time Minimization Techniques For Testing System On Chip
2.	The Research Of SOC Test Method Based On RAS Architecture
3.	Studies On Extended Compatibilities Scan Tree Construction Based On Weighted Compatible Cliques
4.	Studies On Test Application Time Reductions Using Scan Chain Disabling Technique
5.	Research On Low-cost Test Methods Based On CircularScan Structure
6.	Studies On SOC Test Methodologies Based On Bus Scheduling And Buffer Addition
7.	Scan Tree Design To Optimaze The Number Of TSVs And Leaf Nodes For 3D-ICs
8.	Research On Test Data Compression Methods In SOC Based On Full Scan Design
9.	Test pattern generation techniques that target low test application time
10.	Automatic test pattern generator for full scan sequential circuits using limited scan operations
11.	An efficient relaxation-based test width compression technique for multiple scan chain testing
12.	Fault simulation and multiple scan chain design methodology for systems-on-chips (SOC)
13.	Enhanced scan architectures for improving test application time and power
14.	Techniques for high-level testability analysis and optimization
15.	Test pattern generation and test application time reduction algorithms for VLSI circuits
16.	Research On Decomposition-based Test Stimulate Compression Methods For Digital Circuits
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