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Keyword [stuck-open fault]
Result: 1 - 3 | Page: 1 of 1
1.
Research Of I
DDT
ATPG Algorithm Based On Ambiguous Delay Assignments And BIST Test Pattern Generator Design
2.
The Research Of Compression Techniques On Pairs Of Test Vectors Which Were Used In I
DDT
Testing
3.
Transient Current Test Generation And Fault Simulation
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