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Keyword [stuck-at faults]
Result: 1 - 4 | Page: 1 of 1
1.
Testable Design And Testing For The OR-Coincidence Logic System
2.
SAT-based Automatic Test Pattern Generation Of VLSI
3.
On generation of high quality tests for defect detection and diagnosis
4.
MEMC Testability Design Based On Samsung11nm Process
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