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Result: 1 - 19 | Page: 1 of 1
1.
Testable Design And Testing For The OR-Coincidence Logic System
2.
Research Of I
DDT
ATPG Algorithm Based On Ambiguous Delay Assignments And BIST Test Pattern Generator Design
3.
The Research Of Compression Techniques On Pairs Of Test Vectors Which Were Used In I
DDT
Testing
4.
Research Of The Test Generation Algorithm For The Combinational Circuit
5.
SAT-based Automatic Test Pattern Generation Of VLSI
6.
Research Of Reducing Power Consumption For NoC Test
7.
Transient Current Test Generation And Fault Simulation
8.
Frequency Agile Magnetron Stuck
9.
Research On Adaptive Fuzzy Control Methods For Nonlinear Systems
10.
Simulation And Verification Research Based On MT-6000 System Level
11.
Research On SAT-based Test Generation Algorithm For Integrated Circuits
12.
Research On Test Pattern Generation For Stuck-at-fault And Compression Algorithms
13.
Research On Optimization Of Diagnostic Test Pattern Set And Fault Pattern Set
14.
Comparing partial and complete test sets and test metrics
15.
On generation of high quality tests for defect detection and diagnosis
16.
A design for testability scheme for modular and non-modular Quantum Dot Cellular Automata (QCA) employing stuck-at fault model
17.
Maximizing nontarget defect detection using conventional stuck-at fault-based automated test pattern generation tools
18.
MEMC Testability Design Based On Samsung11nm Process
19.
Studies On Hardware Redundancy Methods For Memristive Neural Networks
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