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Keyword [scan test]
Result: 61 - 80 | Page: 4 of 4
61.
Research On Test Data Compression Method Based On Tri-State Signal
62.
Research On Generation And Optimization Method Of Boundary Scan Test Vector For Complex Circuits
63.
Design And Implementation Of Boundary Scan Test System For Complex Digital Circuit Board
64.
Research On CDMA Module Test Based On SCAN
65.
The Key Technologies Of Low-power Parallel Scan Test And Memory Self-Test
66.
Design And Implementation For Test Of SoC Based On IEEE Std. 1149.1 And IEEE Std. 1500
67.
Low-power LFSR Reseeding Test Compression Technology For System On Chip Scan Design
68.
Hardware Circuit Design Of A Built-in Test System For Communication Equipment
69.
Research On Secure Scan Test Architecture Thwarting Scan-Based Side-Channel Attacks
70.
Research On Test System Of Circuit Board Based On Testability Technology
71.
Testability Design Of Radiation Hardened SoC
72.
Research On Built-in Test Technology For Communication Equipment
73.
Design And Implementation Of Boundary-Scan Test Software For Digital-Analog Hybrid Circuit
74.
Research On Cell-aware Based Efficient Testing And Test Cost Optimization
75.
Testability Design Of AVP-DSP Chip
76.
Design And Implementation Of Fault Injection Software Based On Boundary Scan Test Chain
77.
MEMC Testability Design Based On Samsung11nm Process
78.
Research And Implementation Of Low Power DFT Based On Scan Chain And ATPG
79.
Research On Scan Test Method Based On MPU Design For Test
80.
The Fault Diagnosis Of The Digital Circuits
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