Font Size:
a
A
A
Keyword [reseeding]
Result: 1 - 17 | Page: 1 of 1
1.
The Research Of Test Data Compression Based On Coding And Reseeding Techniques
2.
Research On Test Data Compression Of SoC Based On LFSR Reseeding
3.
The Test Data Compression Of System-on-a-Chip (SoC) Based On Dimidiate Partition And Packet-sharing
4.
LFSR Reseeding Test Scheme Based On Dividing Some Vectors
5.
Research On LFSR Reseeding Method Based On Test Date Compression Of Partial Compatibility
6.
The Study On Built-in Self-Test Method Based On Multi-Scan Chains
7.
Research On Test Data Compression Of SoC Based On State Correlativity And Power Division
8.
Research On Bist Of SoC Through Dividing Test Cubes By Equal Number Of Specified Bits
9.
Research On Test Data Compression Of SoC Based On Power Division And Block Coding
10.
Built-In Self Test Research Of Digital Circuit
11.
Seedy Digital Circuits Built-in Self-test And Test Complex Research
12.
Soc Test Data Compression
13.
Research And Simulation Test Of Data Compression Base On LFSR Reseeding
14.
Low-power LFSR Reseeding Test Compression Technology For System On Chip Scan Design
15.
Deterministic built-in self test for digital circuits
16.
Clustering of test cubes: A procedure for the efficient encoding of complete test sets based on the intelligent reseeding of LFSRs
17.
Research On Low-power Test Vector Generation Technology Based On LFSR Reseeding
<<First
<Prev Next>
Last>>
Jump to
